Analysis of the current-transport mechanism across a CVD diamond/silicon interface

Applied Surface Science

Volumn 253, Issue 14, 2007, Pages 5992-5999

  Rodrigues, A M ^a  

^a UNIVERSITY OF ALGARVE   (Portugal)

Author keywords

Characterization of electrical properties; Diamond film; Field emission; Interface electronic properties; Schottky diodes

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; DIAMOND FILMS; FIELD EMISSION; HETEROJUNCTIONS; SCHOTTKY BARRIER DIODES; SILICON;

CURRENT MODELS; IDEALITY FACTOR; INTERFACE ELECTRONIC PROPERTIES; THERMIONIC THEORY;

INTERFACES (MATERIALS);

EID: 34247172531     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.12.111     Document Type: Article

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