Combined AFM-SEM study of the diamond nucleation layer on Ir(001)

Diamond and Related Materials

Volumn 16, Issue 4-7 SPEC. ISS., 2007, Pages 665-670

  Gsell, S ^a   Schreck, M ^a   Benstetter, G ^b   Lodermeier, E ^b   Stritzker, B ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b DEGGENDORF INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Bias enhanced nucleation; Diamond growth and characterization; Heteroepitaxy; Iridium

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; ION BOMBARDMENT; IRIDIUM; NUCLEATION; SCANNING ELECTRON MICROSCOPY;

BIAS ENHANCED NUCLEATION; DIAMOND GROWTH; NUCLEATION LAYERS;

SYNTHETIC DIAMONDS;

EID: 34047247550     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2006.11.091     Document Type: Article

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