Transmission electron microscopy study of the diamond nucleation layer on iridium

Diamond and Related Materials

Volumn 15, Issue 4-8, 2006, Pages 460-464

  Schreck, M ^a   Hormann F ^a   Gsell, S ^a   Bauer, Th ^a   Stritzker, B ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Bias enhanced nucleation; Diamond growth and characterization; Iridium; Transmission electron microscopy

Indexed keywords

AMORPHOUS MATERIALS; DIAMONDS; EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; NUCLEATION; TRANSMISSION ELECTRON MICROSCOPY;

BIAS ENHANCED NUCLEATION (BEN); DIAMOND CRYSTALS; DIAMOND GROWTH AND CHARACTERIZATION; HIGH ANGLE ANNULAR DARK FIELD (HAADF);

IRIDIUM;

EID: 33745265626     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2005.10.039     Document Type: Article

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