Investigation of analogue performance for process-induced-strained PMOSFETs

Semiconductor Science and Technology

Volumn 22, Issue 4, 2007, Pages 404-407

  Kuo, Jack J Y ^a   Chen, William P N ^a   Su, Pin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DRAIN CURRENT; GAIN CONTROL; MICROPROCESSOR CHIPS; TRANSCONDUCTANCE;

ADVANCED STRAINED DEVICES; ANALOGUE METRICS; GAIN BANDWIDTH PRODUCT;

MOSFET DEVICES;

EID: 34047224487     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/22/4/019     Document Type: Article

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