Long-term reliability studies of high-power 808 nm tapered diode lasers with stable beam quality

Semiconductor Science and Technology

Volumn 22, Issue 4, 2007, Pages 374-379

  Dittmar, F ^a   Sumpf, B ^a   Erbert, G ^a   Trankle G ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM QUALITY; EMBEDDED SYSTEMS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; TENSILE STRAIN; WAVEGUIDES;

CONTINUOUS WAVE OPERATIONS; LONG TERM RELIABILITY; TAPERED DIODE LASERS;

SEMICONDUCTOR LASERS;

EID: 34047204607     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/22/4/013     Document Type: Article

References (14)

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