Characterization of vacuum-evaporated ZnSe thin films

Physica B: Condensed Matter

Volumn 393, Issue 1-2, 2007, Pages 47-55

  Venkatachalam, S ^a   Mangalaraj, D ^a   Narayandass, Sa K ^a  

^a BHARATHIAR UNIVERSITY   (India)

Author keywords

Electrical conductivity; Optical; Raman; RBS; SEM; Structural; Vacuum deposition

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTALLITE SIZE; ELECTRIC CONDUCTIVITY; OPTICAL BAND GAPS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; STOICHIOMETRY; VACUUM DEPOSITION; VACUUM EVAPORATION; X RAY DIFFRACTION;

GLASS SUBSTRATES; STRUCTURAL PARAMETERS; SUBSTRATE TEMPERATURE; X RAY DIFFRACTOGRAM;

THIN FILMS;

EID: 34047187873     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.12.047     Document Type: Article

References (30)

1. Yan L., Woollam J.A., and Franke E. J. Vac. Sci. Technol. A 20 3 (2002) 693
2. Shi rakawa T. Mater. Sci. Eng. B 91 92 (2002) 470
3. Godlewski M., Guziewicz E., Kooalko K., Lusakowska E., Dynowska E., Godlewski M.M., Godys E.M., and Phillips M.R. J. Lumin. 102-103 (2003) 455
4. Dobler H.R. Appl. Opt. 28 (1989) 2698
5. Lour W.-S., and Chang C.-C. Solid State Electron. 39 (1996) 1295
6. Ullrich B. Mater. Sci. Eng. B 56 (1998) 69
7. Farrow R.F.C., Jones G.R., Williams G.H., and Young I.M. Appl. Phys. Lett. 39 (1981) 954
8. Matsumoto T., Iuima T., and Goto H. J. Cryst. Growth 99 (1990) 427
9. Noda Y., Ishikawa T., Yamabe M., and Hara Y. Appl. Surf. Sci. 113-114 (1997) 28
10. Pizzo A., Tagliente M.A., Caneve L., and Scaglione S. Thin Solid Films 368 (2000) 8
11. Kim T.W., Jung M., Lee D.V., Oh E., Lee S.D., Jung H.D., Kim M.D., Kim J.R., Park H.S., and Lee J.Y. Thin Solid Films 298 (1997) 187
12. Liu Q., Lakner H., Taudt W., Heuken M., Mendorf C., Heime K., and Kubalek E. J. Cryst. Growth 197 (1999) 507
13. El Sherif M., Terra F.S., and Khodier S.A. J. Mater. Sci-Mater. Electron. 7 6 (1996) 391
14. Jamieson D.N. Nucl. Instr. and Meth. B 136-138 (1998) 1
15. Tolansky S. Multiple Beam Interferometry of Surfaces and Films (1948), Oxford University Press, Oxford p. 147
16. De C.K., and Mishra N.K. Indian J. Phys. 71 (1997) 530
17. Doolitle L.R. Nucl. Instr. and Meth. B 9 3 (1985) 344
18. Lalita P.K.R., Sarma B.K., and Das H.L. Bull. Mater. Sci. 23 4 (2000) 313
19. Machado K.D., de Lima J.C., de Campos C.E.M., Grandi T.A., and Gasperini A.A.M. Solid State Commun. 127 (2003) 477
20. Lakshmikumar S.T., and Rastogi A.C. Thin Solid Films 259 (1995) 150
21. Kumaresan R., Ichimura M., and Arai E. Thin Solid Films 414 (2002) 25
22. Sarigiannis D., Peck J.D., Mountziaris T.J., Kioseoglou G., and Petrou A. MRS Proceed. V. 616 (2000) 41
23. Jan J.-C., Kuo S.-Y., Yin S.-B., and Hsieh W.-F. Chinese J. Phys. 39 (2001) 90
24. Rakshani A.E., Makdisi Y., Mathew X., and Mathews N.R. Phys. Stat. Sol. (a) 168 (1998) 177
25. Lampert M.A. Rep. Prog. Phys. 27 (1964) 329
26. Attia A.A. Egypt J. Sol. 24 2 (2000) 235
27. Oduor A.O., and Gould R.D. Thin Solid Films 317 (1998) 409
28. Palmer DW.: www.semiconductors.co.uk, Doping issues in wide band-gap semiconductors 06 (2002) 1-7.
29. Mahmood F.S., Gould R.D., Hassan A.K., and Salih H.M. Thin Solid Films 270 (1995) 376
30. Kim S.Y. Appl. Opt. 35 34 (1996)