Optical characteristics of thin ZnSe films of different thicknesses

Journal of Materials Science: Materials in Electronics

Volumn 7, Issue 6, 1996, Pages 391-395

  El Sherif, M ^a,b   Terra, F S ^a   Khodier, S A ^a  

^a NATIONAL INSTITUTE FOR STANDARDS   (Egypt)

^b NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; DEPOSITION; ENERGY GAP; EVAPORATION; LIGHT ABSORPTION; LIGHT TRANSMISSION; OPTICAL PROPERTIES; REFLECTION; SEMICONDUCTING ZINC COMPOUNDS; THIN FILMS; X RAY CRYSTALLOGRAPHY;

OPTICAL CONSTANTS; THERMAL EVAPORATION; ZINC SELENIDE;

SEMICONDUCTING FILMS;

EID: 0030396416     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00180775     Document Type: Article

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