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Volumn 1, Issue , 2006, Pages

An effective technique for minimizing the cost of processor software-based diagnosis in SoCs

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; COST EFFECTIVENESS; EVOLUTIONARY ALGORITHMS; NETWORK PROTOCOLS; OPTIMIZATION; PROGRAM DIAGNOSTICS;

EID: 34047148457     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2006.243795     Document Type: Conference Paper
Times cited : (25)

References (16)
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    • 34047190604 scopus 로고
    • A Distiguishability criterion to selecting efficient diagnostic tests
    • H. Y. Chang, "A Distiguishability criterion to selecting efficient diagnostic tests", Proc. Spring Joint Computer Conference, 1968, pp. 529-534.
    • (1968) Proc. Spring Joint Computer Conference , pp. 529-534
    • Chang, H.Y.1
  • 3
    • 2342587244 scopus 로고
    • Fault Detection in Redundant Circuits
    • February
    • A. D. Friedman, "Fault Detection in Redundant Circuits", IEEE Trans. Computers, vol. EC-16, February 1967, pp. 99-100
    • (1967) IEEE Trans. Computers , vol.EC-16 , pp. 99-100
    • Friedman, A.D.1
  • 6
    • 4344646235 scopus 로고    scopus 로고
    • Fault equivalence and diagnostic test generation using ATPG
    • A. Veneris, R. Chang, M.S. Abadir, M. Amiri, "Fault equivalence and diagnostic test generation using ATPG" IEEE ISCAS 2004, Vol.5, pp. V-221 - V-224
    • (2004) IEEE ISCAS , vol.5
    • Veneris, A.1    Chang, R.2    Abadir, M.S.3    Amiri, M.4
  • 7
  • 9
    • 0036054357 scopus 로고    scopus 로고
    • Li Chen, S. Dey, Software-based diagnosis for processors, Design Automation Conference, 2002, pp. 259-262
    • Li Chen, S. Dey, "Software-based diagnosis for processors", Design Automation Conference, 2002, pp. 259-262
  • 12
    • 34047176181 scopus 로고    scopus 로고
    • G. Squillero, MicroGP - An Evolutionary Assembly Program Generator Genetic Programming and Evolvable Machines. Springer Science + Business Media B.V. ISSN: 1389-2576
    • G. Squillero, "MicroGP - An Evolutionary Assembly Program Generator" Genetic Programming and Evolvable Machines. Springer Science + Business Media B.V. ISSN: 1389-2576
  • 13
    • 1942532276 scopus 로고    scopus 로고
    • Automatic Test Program Generation - a Case Study
    • F. Corno, E. Sánchez, M. Sonza Reorda, G. Squillero "Automatic Test Program Generation - a Case Study" IEEE Design & Test, Special issue on Benchmarking for Design and Test, 2004, Volume 21, Issue 2, pp. 102-109
    • (2004) IEEE Design & Test , vol.21 , Issue.2 , pp. 102-109
    • Corno, F.1    Sánchez, E.2    Sonza Reorda, M.3    Squillero, G.4
  • 15
    • 0033726337 scopus 로고    scopus 로고
    • A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits
    • May
    • I. Pomeranz, S. M. Reddy, "A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, May 2000, Volume 19, Issue 5, pp. 589-600
    • (2000) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol.19 , Issue.5 , pp. 589-600
    • Pomeranz, I.1    Reddy, S.M.2
  • 16
    • 0029721859 scopus 로고    scopus 로고
    • Full fault dictionary storage based on labeled tree encoding
    • V. Boppana, I. Hartanto, W.K. Fuchs, "Full fault dictionary storage based on labeled tree encoding", IEEE VLSI Test Symposium, 1996, pp. 174-179.
    • (1996) IEEE VLSI Test Symposium , pp. 174-179
    • Boppana, V.1    Hartanto, I.2    Fuchs, W.K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.