Low-cost software-based self-testing of RISC processor cores

IEE Proceedings: Computers and Digital Techniques

Volumn 150, Issue 5 SPEC. ISS., 2003, Pages 355-360

  Kranitis, N ^a   Xenoulis, G ^b   Gizopoulos, D ^b   Paschalis, A ^a   Zorian, Y ^c  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF PIRAEUS   (Greece)

^c Virage Logic   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); COMPUTER SIMULATION; COST EFFECTIVENESS; DATA STORAGE EQUIPMENT; EMBEDDED SYSTEMS; FAULT TOLERANT COMPUTER SYSTEMS; MICROPROCESSOR CHIPS;

SELF-TESTING METHODOLOGY;

SOFTWARE ENGINEERING;

EID: 0345358548     PISSN: 13502387     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cdt:20030838     Document Type: Conference Paper

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