On the transformation of manufacturing test sets into on-line test sets for microprocessors

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 494-502

  Sanchez E ^a   Reorda, M Sonza ^a   Squillero, G ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; FAULT TOLERANT COMPUTER SYSTEMS; MICROPROCESSOR CHIPS; ONLINE SYSTEMS;

FAULT COVERAGE; MANUFACTURING TEST SET;

BUILT-IN SELF TEST;

EID: 28444457263     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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