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Volumn , Issue , 1996, Pages 192-197
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Sampling technique for diagnostic fault simulation
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
APPROXIMATION THEORY;
COMBINATORIAL CIRCUITS;
COMPUTATIONAL COMPLEXITY;
COMPUTER SIMULATION;
EQUIVALENCE CLASSES;
ERROR DETECTION;
FAILURE ANALYSIS;
SEQUENTIAL CIRCUITS;
DIAGNOSTIC FAULT SIMULATION;
DIAGNOSTIC TEST SETS;
EC IC SAMPLING;
FAULT COVERAGE;
FAULT SAMPLING;
INDISTINGUISHIBLE CLASSES;
STUCK AT FAULTS;
INTEGRATED CIRCUIT TESTING;
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EID: 0029713579
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (16)
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