Diagnostic ATPG for delay faults based on genetic algorithms

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 286-293

  Girard, P ^a   Landrault, C ^a   Pravossoudovitch, S ^a   Rodriguez, B ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; GENETIC ALGORITHMS; LOGIC CIRCUITS;

AUTOMATIC TEST PATTERN GENERATION; ELECTRIC DELAY FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0030385620     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)