Structural and magnetic properties of epitaxially grown Ge 1-xFex thin films: Fe concentration dependence

Applied Physics Letters

Volumn 90, Issue 13, 2007, Pages

  Shuto, Yusuke ^a   Tanaka, Masaaki ^a,b   Sugahara, Satoshi ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURIE TEMPERATURE; DIAMONDS; EPITAXIAL GROWTH; GERMANIUM; MAGNETIC PROPERTIES; MOLECULAR BEAM EPITAXY; THIN FILMS;

CRYSTALLOGRAPHIC PHASE; FERROMAGNETIC SEMICONDUCTORS; STACKING FAULT DEFECTS;

CRYSTAL STRUCTURE;

EID: 34047119074     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2718270     Document Type: Article

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