A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field

Proceedings of the European Test Workshop

Volumn 2003-January, Issue , 2003, Pages 65-70

  Fudoli, A ^a   Ascagni, A ^a   Appello, D ^a   Manhaeve, H ^b  

^a STMICROELECTRONICS   (Italy)

^b Q Star Test   (Belgium)

Author keywords

Conferences; Production; Testing

Indexed keywords

PRODUCTION;

CONFERENCES; DEEP SUB-MICRON; MEASUREMENT EQUIPMENT; MEASUREMENT STRATEGIES; MEASUREMENT TOOLS; SCREENING EFFICIENCY; TEST STRATEGIES; WORK IN PROGRESS;

TESTING;

EID: 33947620342     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2003.1231670     Document Type: Conference Paper

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