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Volumn 2002-January, Issue January, 2002, Pages 81-86

A real world application used to implement a true IDDQ based test strategy (facts and figures)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL VEHICLES; COST REDUCTION; COSTS; PRODUCT DESIGN; QUALITY CONTROL; TESTING;

EID: 84931417474     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2002.1029643     Document Type: Conference Paper
Times cited : (4)

References (19)
  • 1
    • 0023601212 scopus 로고
    • Measurements of quiescent power supply current for CMOS ICs in production testing
    • L.K. Horning et all, Measurements of Quiescent Power Supply Current for CMOS ICs in Production Testing, Proceedings ofthe ITC 1987, pp. 300-309.
    • (1987) Proceedings Ofthe ITC , pp. 300-309
    • Horning, L.K.1    All, E.2
  • 2
    • 0345989165 scopus 로고
    • Detection of "Undetectable" faults using IDDQ testing
    • R.K. Gulati et all, Detection of "Undetectable" Faults using IDDQ Testing, Proceedings ofthe ITC 1992, pp. 770-777.
    • (1992) Proceedings Ofthe ITC , pp. 770-777
    • Gulati, R.K.1    All, E.2
  • 3
    • 0002650001 scopus 로고
    • The effectiveness of IDDQ, functional and scan tests: How many fault coverages do we need?
    • P.C. Maxwell et all, The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages do we need?, Proceedings ofthe ITC 1992, pp. 168-177.
    • (1992) Proceedings Ofthe ITC , pp. 168-177
    • Maxwell, P.C.1    All, E.2
  • 4
    • 0026989259 scopus 로고
    • IDDQ testing: A review
    • J.M. Soden et all, IDDQ Testing: A Review, JETTA, 3, 291-303 (1992).
    • (1992) JETTA , vol.3 , pp. 291-303
    • Soden, J.M.1    All, E.2
  • 5
    • 0026960792 scopus 로고
    • Reliability benefits of IDDQ
    • S.D. McEuen, Reliability Benefits of IDDQ, JETTA, 3, 327-335 (1992).
    • (1992) JETTA , vol.3 , pp. 327-335
    • McEuen, S.D.1
  • 6
    • 0342888509 scopus 로고
    • An off-chip IDDQ current measurement unit for telecommunication ASICs
    • H.A.R. Manhaeve et all, An Off-Chip IDDQ Current Measurement Unit for Telecommunication ASICs, Proceedings ofthe ITC 1994, pp. 203-212.
    • (1994) Proceedings Ofthe ITC , pp. 203-212
    • Manhaeve, H.A.R.1    All, E.2
  • 7
    • 0029487490 scopus 로고
    • On the effect of ISSQ testing in reducing early failure rate
    • K.M. Wallquist, On the Effect of ISSQ Testing in Reducing Early Failure Rate, Proceedings ofthe ITC 1995, pp. 910-914.
    • (1995) Proceedings Ofthe ITC , pp. 910-914
    • Wallquist, K.M.1
  • 9
    • 0030409795 scopus 로고    scopus 로고
    • Burn-in elimination of a high volume microprocessor using IDDQ
    • T.R. Henry, T. Soo, Burn-in Elimination of a High Volume Microprocessor Using IDDQ, Proceedings ofthe ITC 1996, pp. 242-249.
    • (1996) Proceedings Ofthe ITC , pp. 242-249
    • Henry, T.R.1    Soo, T.2
  • 10
    • 0030397203 scopus 로고    scopus 로고
    • IDDQ and AC SCAN: The War against unmodelled defects
    • P.C. Maxwell et all, IDDQ and AC SCAN: The War Against Unmodelled Defects, Proceedings of the ITC 1996, pp. 250-258.
    • (1996) Proceedings of the ITC , pp. 250-258
    • Maxwell, P.C.1    All, E.2
  • 11
    • 0030421840 scopus 로고    scopus 로고
    • Towards an effective IDDQ test vector selection and application methodology
    • J. van Sas, U. Swerts, M. Darquennes, Towards an Effective IDDQ Test Vector Selection and Application Methodology, Proceedings ofthe ITC 1996, pp. 491-500.
    • (1996) Proceedings Ofthe ITC , pp. 491-500
    • Van Sas, J.1    Swerts, U.2    Darquennes, M.3
  • 12
    • 0032313703 scopus 로고    scopus 로고
    • Failure analysis of timing and IDDQ-only failures from the SEMATECH test methods experiments
    • P. Nigh et all, Failure Analysis of Timing and IDDQ-only Failures from the SEMATECH Test Methods Experiments, Proceedings ofthe ITC 1998, pp. 13-52.
    • (1998) Proceedings Ofthe ITC , pp. 13-52
    • Nigh, P.1    All, E.2
  • 13
    • 0032320095 scopus 로고    scopus 로고
    • CMOS IC reliability indicators and burn-in economics
    • A. Righter et all, CMOS IC Reliability Indicators and Burn-in Economics, Proceedings ofthe ITC 1998, pp. 194-203.
    • (1998) Proceedings Ofthe ITC , pp. 194-203
    • Righter, A.1    All, E.2
  • 14
    • 0033315396 scopus 로고    scopus 로고
    • IDDQ testing in deep submicron integrated circuits
    • A.C. Miller, IDDQ Testing in Deep Submicron Integrated Circuits, Proceedings ofthe ITC 1999, pp. 724-729.
    • (1999) Proceedings Ofthe ITC , pp. 724-729
    • Miller, A.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.