Global standardization of scanning probe microscopy

Nanotechnology

Volumn 18, Issue 8, 2007, Pages

  Fujita, Daisuke ^a   Itoh, Hiroshi ^b   Ichimura, Shingo ^b   Kurosawa, Tomizo ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c Japan Quality Assurance Organization (JQA)   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA REDUCTION; IMAGE RECONSTRUCTION; INFORMATION MANAGEMENT; SOCIETIES AND INSTITUTIONS;

ANALYTICAL METHODS; GLOBAL STANDARDIZATION; INTERNATIONAL ORGANIZATION FOR STANDARDIZATION (ISO);

SCANNING PROBE MICROSCOPY;

ANALYTIC METHOD; ARTIFACT; ATOMIC FORCE MICROSCOPY; CALIBRATION; CONFERENCE PAPER; INFORMATION PROCESSING; MORPHOLOGY; NONCONTACT ATOMIC FORCE MICROSCOPY; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; STANDARDIZATION;

EID: 33947517110     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/8/084002     Document Type: Conference Paper

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