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Materials Letters

Volumn 48, Issue 3-4, 2001, Pages 127-136

Characterization of anodic porous alumina by AFM

(2) Sui, YuCheng a Saniger, José M a

a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO (Mexico)

Author keywords

Anodization; Atomic force microscopy (AFM); Nanostructures; Porous alumina; Surface structure; Thin films

Indexed keywords

ANODES; ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; POROUS MATERIALS; SURFACE STRUCTURE; THIN FILMS;

ANODIC ALUMINUM OXIDE;

ALUMINA;

EID: 0035311880 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/S0167-577X(00)00292-5 Document Type: Article

Times cited : (71)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.