Force microscopy imaging of rest atom on Si(111)7x7 surface under strong tip-surface interaction

Journal of the Physical Society of Japan

Volumn 76, Issue 3, 2007, Pages

  Naitoh, Yoshitaka ^a   Momotani, Kohji ^a   Nomura, Hikaru ^a   Li, Yan Jun ^a   Kageshima, Masami ^a   Sugawara, Yasuhiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Adatom; Atomic force microscopy (AFM); Covalent bond; Rest atom; Silicon

Indexed keywords

EID: 33947257279     PISSN: 00319015     EISSN: 13474073     Source Type: Journal    
DOI: 10.1143/JPSJ.76.033601     Document Type: Article

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