Effect of growth orientation and surface roughness on electron transport in silicon nanowires

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 12, 2007, Pages

  Svizhenko, Alexei ^a,b   Leu, Paul W ^a   Cho, Kyeongjae ^a,c  

^a Stanford University   (United States)

^b Silvaco Data Systems Inc   (United States)

^c UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33947233244     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.125417     Document Type: Article

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