SCOPUS 정보 검색 플랫폼

Volumn 87, Issue 4, 2005, Pages

Theoretical investigation of surface roughness scattering in silicon nanowire transistors

Author keywords

[No Author keywords available]

Indexed keywords

FILM THICKNESS; QUANTUM TRANSPORT SIMULATOR; SILICON NANOWIRE TRANSISTOR; SURFACE ROUGHNESS SCATTERING (SRS);

CARRIER CONCENTRATION; FINITE ELEMENT METHOD; NANOSTRUCTURED MATERIALS; QUANTUM THEORY; SILICON; SURFACE ROUGHNESS; TRANSPORT PROPERTIES;

TRANSISTORS;

EID: 23744458365 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2001158 Document Type: Article

Times cited : (142)

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