Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy

Composite Structures

Volumn 79, Issue 4, 2007, Pages 548-553

  Choi, Dukhyun ^a   Jeon, Jihoon ^a   Lee, Pyungsoo ^a   Hwang, Woonbong ^a   Lee, Kunhong ^a   Park, Hyunchul ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

AFM; Nano UTM; Nanohoneycomb structure; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENDING STRENGTH; BENDING TESTS; ELASTIC MODULI; POROSITY; TENSILE TESTING;

AREA MOMENT OF INERTIA; NANOHONEYCOMB STRUCTURES;

HONEYCOMB STRUCTURES;

MICROSCOPY; STRUCTURAL ANALYSIS; TENSILE PROPERTY; TESTING; YOUNG MODULUS;

EID: 33847632138     PISSN: 02638223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compstruct.2006.02.023     Document Type: Article

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