Quasi-static bending test of nano-scale SiO2 wire at intermediate temperatures using AFM-based technique

Sensors and Actuators, A: Physical

Volumn 104, Issue 1, 2003, Pages 78-85

  Namazu, Takahiro ^a   Isono, Yoshitada ^b  

^a UNIVERSITY OF HYOGO   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

AFM bending test; Fracture stress strain; Nano scale SiO2 wire; Specimen size effect; Surface roughness; Weibull parameters; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; BRITTLE FRACTURE; ELASTIC MODULI; NANOSTRUCTURED MATERIALS; SILICA; SINGLE CRYSTALS; STRESS ANALYSIS; SURFACE ROUGHNESS; THERMOOXIDATION; WEIBULL DISTRIBUTION; WIRE;

QUASI-STATIC BENDING TESTS;

SENSORS;

EID: 0037445407     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(02)00431-4     Document Type: Article

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