Towards a structural characterization of an epoxy based polymer using small-angle x-ray scattering

Journal of Applied Physics

Volumn 101, Issue 4, 2007, Pages

  Medhioub, H ^a,b   Zerrouki, C ^a   Fourati, N ^a   Smaoui, H ^b   Guermazi, H ^b   Bonnet, J J ^a  

^a University of Paris Cité   (France)

^b HEDI CHAKER HOSPITAL   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

EPOXY RESINS; REFLECTION; X RAY SCATTERING;

EPOXY BASED POLYMERS; MEAN ORIENTATION; ROCKING CURVE MEASUREMENTS; SHORT DISTANCE ORDERS;

ORGANIC POLYMERS;

EID: 33847621175     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2511890     Document Type: Article

References (21)

1. H. Smaoui, H. Germazi, S. Agnel, Y. Mlik, and A. Toureille, Polym. Int. 49, 1513 (2000).
2. H. Smaoui, Ph.D. thesis, FSS, Tunisie, 2003.
3. R. Paniago, H. Homma, P. C. Chow, S. C. Moss, A. Barena, S. S. P. Parkin, and D. Cookson, Phys. Rev. B 52, R17052 (1995).
4. T. H. Metzeger, I. Kegel, R. Paniago, and J. Peisl, J. Phys. D 32, A202 (1999).
5. T. P. A. Hase, E. M. Ho, J.-J. Freijo, S. M. Thompson, A. K. Petford-Long, and B. K. Tanner, J. Phys. D 36, A231 (2003).
6. S. Hayashi, D. Bruno, R. Sandhu, and M. S. Goorsky, J. Phys. D 36, A236 (2003).
7. C.-H. Hsu, U.-S. Jeng, H.-Y. Lee, C.-M. Huang, K. S. Liang, D. Windover, T.-M. Lu, and C. Jin, Thin Solid Films 472, 323 (2005).
8. T. Kawamura, S. Bhunia, Y. Watanabe, S. Fujikawa, J. Matsui, Y. Kagoshima, and Y. Tsusaka, Appl. Surf. Sci. 216, 361 (2003).
9. D. G. Stearns, D. P. Gaines, and D. W. Sweeney, J. Appl. Phys. 84, 1003 (1998).
10. J. M. Freitag and B. M. Clemens, J. Appl. Phys. 89, 1001 (2001).
11. A. Ulyanenkov, K. Omote, R. Matsuo, J. Harada, and S.-Y. Matsuno, J. Phys. D 32, 1313 (1999).
12. J. Clarke, I. Pape, P. Normile, and B. K. Tanner, J. Phys. D 36, A209 (2003).
13. G. F. Neilson and S. A. Jabarin, J. Appl. Phys. 46, 1175 (1975).
14. Th. Geue, M. Schultz, J. Grenzer, U. Pietsch, A. Natansohn, and P. Rochon, J. Appl. Phys. 87, 7712 (2000).
15. U. Pietsch, Phys. Rev. B 66, 155430 (2002).
16. H. Medhioub, C. Zerrouki, N. Fourati, H. Smaoui, M. Chassevent, H. Guermazi, and J. J. Bonnet, Proceedings of 5́me Colloque Francophone Ḿthodes et Techniques Optiques pour l'industrie (SFP, Saint-Étienne, 2004), p. 598.
17. E. Tollens, S. Menecier, Y. Haidar, C. Zerrouki, M. Chasevent, F. de Fornel, and J. J. Bonnet, J. Phys. IV 118, 395 (2004).
18. Y. Haidar, E. Tollens, Z. Silvestri, F. De Fornel, C. Zerrouki, A. Picard, and P. Pinot, Metrologia 42, 115 (2005).
19. C. Zerrouki, M. Chassevent, N. Fourati, M. Bonnefoy, P. Lepeut, and J. J. Bonnet, Proceedings of C2I (Edition Hermes, Paris, 2004), Vol. 1, p. 69.
20. Y. Yoneda, Phys. Rev. 131, 2010 (1963).
21. C. Zerrouki, M. Chassevent, N. Fourati, E. Tollens, and J. J. Bonnet, J. Phys. IV 118, 149 (2004).