Study and comparison of two polishing methods for platinum-iridium surfaces, by means of three characterization techniques

Metrologia

Volumn 42, Issue 2, 2005, Pages 115-128

  Haidar, Y ^a   Tollens, E ^b   Silvestri, Z ^b   De Fornel, F ^a   Zerrouki, C ^b   Picard, A ^c   Pinot, P ^b  

^a LPUB   (France)

^b University of Paris Cité   (France)

^c PAVILLON DE BRETEUIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CHEMICAL POLISHING; IMAGE ANALYSIS; IRIDIUM; LIGHT SCATTERING; REFLECTOMETERS; SURFACE ROUGHNESS;

LIGHT SCATTERING MEASUREMENTS; MASS STANDARDS; POWER SPECTRAL DENSITIES (PSD); SHEAR FORCE MICROSCOPY (SHFM);

PLATINUM;

EID: 24144476296     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/42/2/006     Document Type: Article

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