Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Hase, T P A ^a   Ho, E M ^b   Freijo, J J ^c   Thompson, S M ^a   Petford Long, A K ^b   Tanner, B K ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; COBALT; CRYSTAL STRUCTURE; EVAPORATION; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MULTILAYERS; POLYCRYSTALLINE MATERIALS; SILICON; SURFACE ROUGHNESS; X RAY SCATTERING;

GRAZING INCIDENCE X RAY SCATTERING; THIN MISCIBLE FILMS; ULTRAHIGH VACUUM EVAPORATION;

THIN FILMS;

EID: 0038621815     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10A/348     Document Type: Article

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