Grain size estimations of annealed Ti-Ni shape memory thin films

Journal of Alloys and Compounds

Volumn 432, Issue 1-2, 2007, Pages 318-322

  Zhang, Lei ^a   Xie, Chaoying ^a   Wu, Jiansheng ^a  

^a Department of Materials Science   (China)

Author keywords

Grain size; Microstrains; Ti Ni thin films; XRD profile analysis

Indexed keywords

ANNEALING; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; FILM PREPARATION; GRAIN SIZE AND SHAPE; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

MICROSTRAINS; PRECIPITATE PHASES; PROFILE ANALYSIS;

THIN FILMS;

EID: 33847384672     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.06.018     Document Type: Article

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