Dislocation density tensor identification by coupling micromechanics and X-ray diffraction line broadening

Materials Science and Engineering: A

Volumn 400-401, Issue 1-2 SUPPL., 2005, Pages 142-145

  Bougrab, Hakim ^a   Inal, Karim ^a   Leoni, Matteo ^b  

^a UNIVERSITÉ PAUL VERLAINE METZ   (France)

^b UNIVERSITY OF TRENTO   (Italy)

Author keywords

Dislocation density tensor; Green's function; Lattice distortion; Line profile broadening; Periodic dislocation configuration; X ray diffraction

Indexed keywords

COMPOSITE MICROMECHANICS; COMPUTER SIMULATION; DENSITY (SPECIFIC GRAVITY); GREEN'S FUNCTION; MICROSTRUCTURE; TENSORS; X RAY DIFFRACTION;

DISLOCATION DENSITY; DISLOCATION FIELDS; MICROMECHANICAL DISLOCATION THEORY; X-RAY DIFFRACTION LINE BROADENING;

DISLOCATIONS (CRYSTALS);

DISLOCATION;

EID: 21744458720     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2005.02.079     Document Type: Article

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