Grain size measurement of nanocrystalline gold by X-ray diffraction method

Nanostructured Materials

Volumn 12, Issue 5, 1999, Pages 657-660

  Inami, T ^a   Kobiyama, M ^a   Okuda, S ^b   Maeta, H ^c   Ohtsuka, H ^c  

^a IBARAKI UNIVERSITY   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; EVAPORATION; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; NUMERICAL ANALYSIS; RESIDUAL STRESSES; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

GRAIN SIZE MEASUREMENT; INTEGRAL BREADTH ANALYSIS; WARREN-AVERBACH ANALYSIS;

GOLD;

EID: 0032594047     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(99)00210-X     Document Type: Article

References (7)

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