Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers

Journal of Crystal Growth

Volumn 300, Issue 1, 2007, Pages 233-238

  Darakchieva, V ^a   Paskova, T ^b   Schubert, M ^c   Paskov, P P ^a   Arwin, H ^a   Monemar, B ^a   Hommel, D ^b   Heuken, M ^d   Off, J ^e   Haskell, B A ^f   Fini, P T ^f   Speck, J S ^f   Nakamura, S ^f  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UNIVERSITY OF BREMEN   (Germany)

^c UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^d AIXTRON AG   (Germany)

^e UNIVERSITY OF STUTTGART   (Germany)

^f University of California   (United States)

Author keywords

A1. High resolution X ray diffraction; A1. Infrared spectroscopic ellipsometry; A1. Phonons; B1. GaN

Indexed keywords

ANISOTROPY; DEFORMATION; GALLIUM NITRIDE; STRAIN; THIN FILMS; X RAY DIFFRACTION;

GENERALIZED INFRARED SPECTROSCOPIC ELLIPSOMETRY (GIRSE); HIGH-RESOLUTION X-RAY DIFFRACTION; INFRARED SPECTROSCOPIC ELLIPSOMETRY; STRAIN ANISOTROPY;

PHONONS;

EID: 33847263409     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.11.023     Document Type: Article

References (20)

1. Alemu A., Gil B., Julier M., and Nakamura S. Phys. Rev. B 57 (1998) 3761
2. Paskov P.P., Darakchieva V., Paskova T., Holtz P.O., and Monemar B. Phys. Stat. Sol. B 234 (2002) 892
3. Paskov P.P., Schifano R., Monemar B., Paskova T., Figge S., and Hommel D. J. Appl. Phys. 98 (2005) 093519
4. Ghosh S., Misra P., Grahn H.T., Ilmer B., Nakamura S., DenBaars S.P., and Speck J.S. Appl. Phys. Lett. 98 (2005) 026105
5. Ghosh S., Waltereit P., Brandt O., Grahn H.T., and Ploog K.H. Phys. Rev. B 65 (2002) 075202
6. Ghosh S., Waltereit P., Brandt O., Grahn H.T., and Ploog K.H. Appl. Phys. Lett. 80 (2002) 413
7. Darakchieva V., Paskov P.P., Paskova T., Valcheva E., Monemar B., and Heuken M. Appl. Phys. Lett. 82 (2003) 703
8. Wang H., Chen C., Gong Z., Zhang J., Gaewski M., Su M., Yang J., and Asif Khan M. Appl. Phys. Lett. 84 (2004) 499
9. Paskova T., Darakchieva V., Paskov P.P., Birch J., Valcheva E., Persson P.O.A., Arnaudov B., Tungasmita S., and Monemar B. J. Crystal Growth 281 (2005) 55
10. Wagner J.-M., and Bechstedt F. Phys. Rev. B 66 (2002) 115202
11. Davydov V.Yu., Averkiev N.S., Goncharuk I.N., Nelson D.K., Nikitina I.P., Polkovnikov A.S., Smirnov A.N., Jacobson M.A., and Semchinova O.K. J. Appl. Phys. 82 (1997) 5097
12. Demangeot F., Frandon J., Baules P., Natali F., Semond F., and Massies J. Phys. Rev. B 69 (2004) 155215
13. J. Off, Ph.D. Thesis, Shaker Verlag, 2001 ISBN 3-8265-9373-1.
14. Haskell B.A., Wu F., Matsuda S., Craven M.D., Fini P.T., DenBaars S.P., Speck J.S., and Nakamura S. Appl. Phys. Lett. 83 (2003) 1554
15. Darakchieva V., Birch J., Schubert M., Paskova T., Tungasmita S., Wagner G., Kasic A., and Monemar B. Phys. Rev. B 70 (2004) 045411
16. Angerer H., Brunner D., Freudenberg F., Ambacher O., Stuzmann M., Höpler R., Metzger T., Born E., Dollinger G., Bergmaier A., Karsch S., and Körner H.-J. Appl. Phys. Lett. 71 (1997) 1504
17. Leszczynski M., Suski T., Teisseyre H., Perlin P., Grzegory I., Jun J., and Porowski S. J. Appl. Phys. 76 (1994) 4909
18. Schubert M. Phys. Rev. B 53 (1996) 4265
19. M. Schubert, Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons, vol. 209, Springer, Heidelberg, 2004, ISBN 3-540-23249-4.
20. Yamaguchi M., Yagi T., Azuhata T., Sota T., Suzuki K., Chichibu S., and Nakamura S. J. Phys. Condens. Matter 9 (1997) 241