Strain-related structural and vibrational properties of thin epitaxial AIN layers

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 4, 2004, Pages

  Darakchieva, V ^a   Birch, J ^a   Schubert, M ^b   Paskova, T ^a   Tungasmita, S ^a   Wagner, G ^b   Kasic, A ^b   Monemar, B ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELLIPSOMETRY; FILM; MATERIALS TESTING; MOLECULAR DYNAMICS; MOLECULAR MODEL; OSCILLATORY POTENTIAL; PHONON; STRESS STRAIN RELATIONSHIP; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 45849154488     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.045411     Document Type: Article

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