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Volumn , Issue , 2003, Pages 560-565

Seed encoding with LFSRs and cellular automata

Author keywords

Built In Self Test; Reseeding; VLSI Test

Indexed keywords

COSTS; DEGREES OF FREEDOM (MECHANICS); ROM; SIGNAL ENCODING; TIMING CIRCUITS; VLSI CIRCUITS;

EID: 0042635681     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775832.775975     Document Type: Conference Paper
Times cited : (43)

References (16)
  • 1
    • 34547820821 scopus 로고    scopus 로고
    • Built-in reseeding for serial BIST
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    • [Alyamani 03a] Al-Yamani A., and E. J. McCluskey, "Built-In Reseeding for Serial BIST", VLSI Test Symposium, Apr., 2003.
    • (2003) VLSI Test Symposium
    • Al-Yamani, A.1    McCluskey, E.J.2
  • 4
    • 0020752337 scopus 로고
    • Random-pattern coverage enhancement and diagnosis for LSSD logic self-test
    • [Eichelberger 83] May
    • [Eichelberger 83] Eichelberger, E. B., and E. Lindbloom, "Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test", IBM Journal of Research and Development, Vol. 27, No. 3, pp. 265-272, May 1983.
    • (1983) IBM Journal of Research and Development , vol.27 , Issue.3 , pp. 265-272
    • Eichelberger, E.B.1    Lindbloom, E.2
  • 7
    • 0029252184 scopus 로고
    • Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
    • [Hellebrand 95] Feb.
    • [Hellebrand 95] Hellebrand, S., J. Rajski, S. Tarnick, S. Venkataraman and B. Courtois, "Built-in Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers," IEEE Transactions on Computers, Vol. 44, No. 2, pp. 223-233, Feb. 1995.
    • (1995) IEEE Transactions on Computers , vol.44 , Issue.2 , pp. 223-233
    • Hellebrand, S.1    Rajski, J.2    Tarnick, S.3    Venkataraman, S.4    Courtois, B.5
  • 8
    • 0002446741 scopus 로고
    • LFSR-coded test patterns for scan designs
    • [Koenemann 91]
    • [Koenemann 91] Koenemann, B., "LFSR-Coded Test Patterns for Scan Designs," Proc. of European Test Conference, pp. 237-242, 1991.
    • (1991) Proc. of European Test Conference , pp. 237-242
    • Koenemann, B.1
  • 12
    • 0022044251 scopus 로고
    • Built-in self-test techniques
    • [McCluskey 85] Apr.
    • [McCluskey 85] McCluskey, E.J., "Built-In Self-Test Techniques," IEEE Design & Test, pp. 21-28, Apr. 1985.
    • (1985) IEEE Design & Test , pp. 21-28
    • McCluskey, E.J.1
  • 13
    • 0032204454 scopus 로고    scopus 로고
    • Test data decompression for multiple scan designs with boundary scan
    • [Rajski 98] Nov.
    • [Rajski 98] Rajski, J., J. Tyszer and N. Zacharia, "Test Data Decompression for Multiple Scan Designs with Boundary Scan," IEEE Transactions on Computers, Vol. 47, No. 11, pp. 1188-1200, Nov. 1998.
    • (1998) IEEE Transactions on Computers , vol.47 , Issue.11 , pp. 1188-1200
    • Rajski, J.1    Tyszer, J.2    Zacharia, N.3
  • 14
  • 16
    • 0025442153 scopus 로고
    • Multiple distributions for biased random test patterns
    • [Wunderlich 90] Jun.
    • [Wunderlich 90] Wunderlich, H.-J., "Multiple Distributions for Biased Random Test Patterns," IEEE Transactions on CAD, Vol. 9, No. 6, pp.584-593, Jun. 1990.
    • (1990) IEEE Transactions on CAD , vol.9 , Issue.6 , pp. 584-593
    • Wunderlich, H.-J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.