Leakage current analysis of diamond Schottky barrier diode

Applied Physics Letters

Volumn 90, Issue 7, 2007, Pages

  Umezawa, Hitoshi ^a   Saito, Takeyasu ^a   Tokuda, Norio ^a   Ogura, Masahiko ^a   Ri, Sung Gi ^a   Yoshikawa, Hiromichi ^a   Shikata, Shin Ichi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIAMONDS; LEAKAGE CURRENTS; MATHEMATICAL MODELS; THERMIONIC EMISSION;

DIAMOND SCHOTTKY BARRIER DIODES; NONEPITAXIAL CRYSTALLITES (NC); THERMIONIC-FIELD EMISSION (TFE) MODELS;

SCHOTTKY BARRIER DIODES;

EID: 33847165302     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2643374     Document Type: Article

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