Diagnosis of the failing component in RF receivers through adaptive full-path measurements

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 374-379

  Acar, Erkan ^a   Ozev, Sule ^a  

^a DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE DIAGNOSIS; COMPONENT-BASED TESTING; DIAGNOSIS METHODS; DIAGNOSTIC RESOLUTION; INDIVIDUAL COMPONENTS; NONLINEAR BEHAVIOR; RADIOFREQUENCY-TRANSCEIVER; TIME-TO-MARKET WINDOW;

TESTING; TRANSCEIVERS;

RADIO RECEIVERS;

EID: 33845463321     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.42     Document Type: Conference Paper

References (9)

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