Development of gas cluster ion beam surface treatments for reducing field emission and breakdown in RF cavities

AIP Conference Proceedings

Volumn 877, Issue , 2006, Pages 370-377

  Swenson, D R ^a   Wu, A T ^b   Degenkolb, E ^a   Insepov, Z ^c  

^a Epion Corporation   (United States)

^b THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Cluster surface interactions; Field emission; Gas cluster ion beam; RF breakdown; Superconducting RF cavity

Indexed keywords

EID: 33847078848     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2409158     Document Type: Conference Paper

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