Smoothing RF cavities with gas cluster ions to mitigate high voltage breakdown

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 241, Issue 1-4, 2005, Pages 641-644

  Swenson, D R ^a   Degenkolb, E ^a   Insepov, Z ^b   Laurent, L ^c   Scheitrum, G ^c  

^a Epion Corporation   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Cluster beam; Cluster surface interactions; Kilpatrick limit; RF breakdown

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRODES; ION BEAM ASSISTED DEPOSITION; ION BEAMS; SURFACE ROUGHNESS; SURFACE STRUCTURE;

CLUSTER BEAMS; CLUSTER-SURFACE INTERACTIONS; KILPATRICK LIMIT; RF BREAKDOWN;

NATURAL FREQUENCIES;

EID: 28044436938     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.07.107     Document Type: Conference Paper

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