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Volumn 92, Issue 7, 2002, Pages 3671-3678

Craters on silicon surfaces created by gas cluster ion impacts

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CLUSTER IMPACT; CRATER DEPTH; CROSS SECTION; FLUENCES; FOUR-FOLD SYMMETRY; GAS CLUSTERS; GAS SOURCES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; HYBRID MOLECULAR DYNAMICS; LOWER ENERGIES; SI (1 1 1); SI(1 0 0); SI(111) SUBSTRATE; SILICON SURFACES; THREE-FOLD SYMMETRY;

EID: 18644362748     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1506422     Document Type: Article
Times cited : (55)

References (27)
  • 25
    • 84861451845 scopus 로고    scopus 로고
    • (woodc@onr.navy.mil, ONR, Arlington, VA)
    • (woodc@onr.navy.mil, ONR, Arlington, VA).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.