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Volumn 39, Issue 23, 2006, Pages 5033-5036

Preparation and ferroelectric properties of Bi4Zr 0.5Ti2.5O12 thin films on LaNiO3 bottom electrode by the sol-gel method

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; ELECTRODES; FERROELECTRICITY; PERMITTIVITY; SOL-GELS; SYNTHESIS (CHEMICAL);

EID: 33846887199     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/23/020     Document Type: Article
Times cited : (10)

References (15)
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    • Lanthanum-substituted bismuth titanate for use in non-volatile memories
    • Park B H et al 1999 Lanthanum-substituted bismuth titanate for use in non-volatile memories Nature 401 682-4
    • (1999) Nature , vol.401 , Issue.6754 , pp. 682-684
    • Park, B.H.1    Al, E.2
  • 3
    • 0037076982 scopus 로고    scopus 로고
    • 12 films of uniform a-axis orientation on silicon substrates
    • 12 films of uniform a-axis orientation on silicon substrates Science 296 2006-9
    • (2002) Science , vol.296 , Issue.5575 , pp. 2006-2009
    • Lee, H.N.1    Hesse, D.2    Zakharov, N.3    Gosele, U.4
  • 11
    • 4944239157 scopus 로고    scopus 로고
    • Microstructure and electrical properties of PZT ferroelectric films on different bottom electrodes.
    • Jiankang L and Xi Y 2004 Microstructure and electrical properties of PZT ferroelectric films on different bottom electrodes. Mater. Lett. 58 3447-50
    • (2004) Mater. Lett. , vol.58 , Issue.27-28 , pp. 3447-3450
    • Jiankang, L.1    Xi, Y.2
  • 12
    • 0031220820 scopus 로고    scopus 로고
    • Development of low dielectric constant ferroelectric materials for the ferroelectric memory field effect transistor
    • Fujimori Y, Izumi N and Nakamura T 1997 Development of low dielectric constant ferroelectric materials for the ferroelectric memory field effect transistor Japan. J. Appl. Phys. 36 5935-8
    • (1997) Japan. J. Appl. Phys. , vol.36 , Issue.PART 1 , pp. 5935-5938
    • Fujimori, Y.1    Izumi, N.2    Nakamura, T.3
  • 14
    • 0036639288 scopus 로고    scopus 로고
    • Structure-property relationships in pure and acceptor-doped BST thin films for tunable microwave device applications
    • Cole M W, Hubbard C, Ngo E, Ervin M, Wood M and Geyer R G 2002 Structure-property relationships in pure and acceptor-doped BST thin films for tunable microwave device applications J. Appl. Phys. 92 475-83
    • (2002) J. Appl. Phys. , vol.92 , Issue.1 , pp. 475-483
    • Cole, M.W.1    Hubbard, C.2    Ngo, E.3    Ervin, M.4    Wood, M.5    Geyer, R.G.6
  • 15
    • 0000838110 scopus 로고    scopus 로고
    • 3 ferroelectric thin films
    • 3 ferroelectric thin films J. Appl. Phys. 83 7789-98
    • (1998) J. Appl. Phys. , vol.83 , Issue.12 , pp. 7789-7798
    • Du, X.1    Chen, I.-W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.