Effects of Zr substitution on structures and ferroelectric properties of Bi3.25la0.75Ti3O12 thin films

Journal of Physics D: Applied Physics

Volumn 38, Issue 9, 2005, Pages 1355-1360

  Lv, L P ^a   Zhang, S T ^a   Wang, J ^a   Chen, Y F ^a   Liu, Z G ^a   Zhao, X N ^a   Cheng, G X ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; NATURAL FREQUENCIES; SCANNING ELECTRON MICROSCOPY; SUBSTITUTION REACTIONS; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

FATIGUE RESISTANCE; FEROELECTRIC PROPERTIES; LOW-FREQUENCY SHIFT; SUBSTITUTION TOLERANCE;

THIN FILMS;

EID: 24144502079     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/9/005     Document Type: Article

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