Effect of excess Pb on crystallinity and ferroelectric properties of PZT(40/60) films on LaNiO 3 coated Si substrates by MOD technique

Applied Surface Science

Volumn 240, Issue 1-4, 2005, Pages 275-279

  Ma, J H ^a   Meng, X J ^a   Sun, J L ^a   Lin, T ^a   Shi, F W ^a   Wang, G S ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Crystallinity; Excess Pb; Ferroelectric properties; PZT thin films

Indexed keywords

CONCENTRATION (PROCESS); CRYSTALLINE MATERIALS; DECOMPOSITION; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; ELECTRODES; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; PEROVSKITE; POLARIZATION; SILICON; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINITY; EXCESS PB; FERROELECTRIC PROPERTIES; PZT THIN FILMS;

LEAD;

EID: 10444233611     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.06.120     Document Type: Article

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