Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Materials Science and Engineering: B

Volumn 137, Issue 1-3, 2007, Pages 304-309

  Jiang, Y P ^a   Tang, X G ^a   Liu, Q X ^a   Li, Q ^a   Ding, A L ^b  

^a GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Absorption bandgap; PZT films; Refractive index; Sol gel; Spectroscopic ellipsometry

Indexed keywords

CHEMICAL ANALYSIS; ELLIPSOMETRY; FILM GROWTH; INORGANIC COATINGS; LEAD COMPOUNDS; OPTICAL PROPERTIES; PLATINUM; REFRACTIVE INDEX; SILICON;

ABSORPTION BANDGAP; OPTICAL CONSTANTS; PHASE FITTING;

THIN FILMS;

EID: 33846807355     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.11.025     Document Type: Article

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