Microstructure and electrical properties of ferroelectric Pb(Zr0.53Ti0.47)O3 films on Si with TiO2 buffer layers

Journal of Physics Condensed Matter

Volumn 12, Issue 43, 2000, Pages 9189-9194

  Liu, Xiaohua ^a   Liu, Z G ^a   Yin, J ^a   Liu, J M ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DEPOSITION; ELECTRIC POTENTIAL; EXCIMER LASERS; FERRIMAGNETIC MATERIALS; INTERDIFFUSION (SOLIDS); LEAD COMPOUNDS; METALLOGRAPHIC MICROSTRUCTURE; PULSED LASER APPLICATIONS; SEMICONDUCTING SILICON; THIN FILMS; TITANIUM OXIDES;

LEAD ZIRCONIUM TITANATE; PULSED LASER DEPOSITION;

DIELECTRIC FILMS;

EID: 0034296440     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/43/309     Document Type: Article

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