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Thin Solid Films

Volumn 305, Issue 1-2, 1997, Pages 219-226

Spectroscopic characterization of electron-beam evaporated V2O5 thin films

(4) Ramana, C V a Hussain, O M a Naidu, B Srinivasulu a Reddy, P J a

a SRI VENKATESWARA UNIVERSITY (India)

Author keywords

Composition; Structure and optical properties; V2O5 thin films

Indexed keywords

ANNEALING; ELECTRON BEAMS; ENERGY GAP; EVAPORATION; FILM PREPARATION; HIGH TEMPERATURE EFFECTS; INFRARED SPECTROSCOPY; OXIDATION; RAMAN SPECTROSCOPY; THIN FILMS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROSCOPY (ICPAES); VANDIUM PENTOXIDE;

SEMICONDUCTING FILMS;

EID: 0031210177 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00141-7 Document Type: Article

Times cited : (185)

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