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Volumn 244, Issue 1-4, 2005, Pages 338-342

Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions

Author keywords

Ellipsometry; Optical constants; PZT films; Reflectometry

Indexed keywords

DEPOSITION; DISPERSIONS; ELLIPSOMETRY; LEAD COMPOUNDS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SOL-GELS; SPECTROSCOPIC ANALYSIS; TRANSITION METALS;

EID: 15844425469     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.10.089     Document Type: Conference Paper
Times cited : (14)

References (18)
  • 17
    • 0038695308 scopus 로고    scopus 로고
    • E. Wolf (Ed.) North-Holland, Amsterdam
    • I. Ohlídal, D. Franta, in: E. Wolf (Ed.), Progress in Optics, vol. 41, North-Holland, Amsterdam, 2000, pp. 181-282.
    • (2000) Progress in Optics , vol.41 , pp. 181-282
    • Ohlídal, I.1    Franta, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.