Conducting atomic force microscopy by half-metallic ferromagnetic CrO 2-Coated cantilever

Journal of the Korean Physical Society

Volumn 49, Issue SUPPL. 2, 2006, Pages

  Son, J Y ^a   Cho, J H ^a  

^a Pusan National University   (South Korea)

Author keywords

CAFM; CrO2 film; Metal coated cantilever

Indexed keywords

EID: 33846338532     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (27)

1. V. Da Costa, C. Tiusan, T. Dimopoulos and K. Ounadjela, Phys. Rev. Lett. 85, 876 (2000).
2. Y. Ando, H. Kameda, H. Kubota and T. Miyazaki, J. Appl. Phys. 87, 5206 (2000).
3. A. Olbrich, B. Ebersberger, C. Boit, J. Vancea, H. Hoffmann, H. Altmann, G. Gieres and J. Wecker, Appl. Phys. Lett. 78, 2934 (2001).
4. B. Rezek, J. Stuchl, K. A. Fejfar and J. Kocka, Appl. Phys. Lett. 74, 1475 (1999).
5. D. Azulay, I. Balberg, V. Chu, J. P. Conde and O. Millo, Phys. Rev. B 71, 113304 (2005).
6. Yoshinori Suganuma and Al-Amin Dhirani, Phys. Rev. B 66, 113304 (2002).
7. Dawn A. Bonnell, Scanning Probe Microscopy and Spectroscopy (Wiley-VCH, New York, 2000).
8. Makoto Iwata, Kohei Katsuraya, Maeda Masaki, Ikuo Suzuki, Naohiko Yasuda and Yoshihiro Ishibashi, J. Korean Phys. Soc. 46, 1 (2005).
9. J. Y. Son, S. H. Bang, C. H. Kim, H. B. Moon, Y. H. Jang, K. S. Song, Bog-G. Kim and J. H. Cho, J. Korean Phys. Soc. 46, 108 (2005).
10. Bog-G. Kim, J. Y. Son and J. H. Cho, J. Korean Phys. Soc. 46, 33 (2005).
11. Chanhyung Kim, Bongki Lee, Hee Jung Yang, Hyun Min Lee, Jae Gab Lee and Hyunjung Shin, J. Korean Phys. Soc. 47, 47 (2005).
12. N. Barniol, F. Perez-Murano and X. Aymerich, Appl. Phys. Lett. 63, 61 (1992).
13. H. C. Day and D. R. Allee, Appl. Phys. Lett. 62, 2691 (1993).
14. T. Hattori, Y. Ejiri and K. Saito, J. Vac. Sci. Technol. A 12, 2586 (1994).
15. H. De Wolf, R. Stephenson, T. Trenkler, T. Clarysse, T. Hantschel and W. Vandervorst, J. Vac. Sci. Technol. B 18, 361 (2000).
16. G. Rinaldi, M. Packirisamy and Ion Stiharu, Proc. SPIE Int. Opt. Eng. 5970, 597017 (2005).
17. R. J. Soulen, Jr., J. M. Byers, M. S. Osofsky, B. Nadgorny, T. Ambrose, S. F. Cheng, P. R. Broussard, C. T. Tanaka, J. Nowak, J. S. Moodera, A. Barry and J. M. D. Coey, Science 282, 85 (1998).
18. K. Schwartz, J. Phys. F: Met. Phys. 16, L211 (1986).
19. K. P. Kamper, W. Schmitt and G. Guntherodt, Phys. Rev. Lett. 59, 2788 (1987).
20. P. Porta, M. Marezio, J. P. Remeika and P. D. Dernier, Mater. Res. Bull. 7, 157 (1972).
21. F. Y. Yang, C. L. Chien, E. F. Ferrari, X. W. Li, G. Xiao and A. Gupta, Appl. Phys. Lett. 77, 286 (2000).
22. G. V. Samsonov, Handbook of the Physicochemical Properties of the Elements (IFI-Plenum, New York, 1968).
23. B. Bhushan and V. N. Koinkar, Wear. 180, 9 (1995).
24. S. Gold, E. Goering, C. Konig, U. Rudiger, G. Guntherodt and G. Schutz, Phys. Rev. B 71, 220404 (2005).
25. J. Y. Son, S. H. Bang, J. W. Park, Y. H. Jang and J. H. Cho, J. Appl. Phys. 95, 6462 (2004).
26. S. Ishibashi, T. Namikawa and M. Satou, Mat. Res. Bull. 14, 51 (1979).
27. Jianbiao Dai and Jinke Tang, J. Appl. Phys. 89, 6763 (2001).