Tunneling phenomena as a probe to investigate atomic scale fluctuations in metal/oxide/metal magnetic tunnel junctions

Physical Review Letters

Volumn 85, Issue 4, 2000, Pages 876-879

  Da Costa, V ^a   Tiusan, C ^a   Dimopoulos, T ^a   Ounadjela, K ^a  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMS; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); MAGNETORESISTANCE; METALS; OXIDES; SEMICONDUCTOR JUNCTIONS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC SCALE FLUCTUATIONS; DIELECTRIC BREAKDOWN VOLTAGE; METAL OXIDE METAL MAGNETIC TUNNEL JUNCTIONS; TUNNEL BARRIERS; TUNNELING PHENOMENA;

ELECTRON TUNNELING;

EID: 13644257367     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.876     Document Type: Article

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