Kelvin probe force microscopy study of epitaxial and polycrystalline PbZr 0.53Ti 0.47 O 3 thin films for high density non-volatile storage devices

Journal of the Korean Physical Society

Volumn 46, Issue 1, 2005, Pages 108-111

  Son, J Y ^a   Bang, S H ^a   Kim, C H ^a   Moon, H B ^a   Jang, Y H ^a   Song, K S ^a   Kim, Bog G ^a   Cho, J H ^a  

^a Pusan National University   (South Korea)

Author keywords

KFM; PZT; Storage

Indexed keywords

EID: 12944273347     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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