Local current distribution in a ferromagnetic tunnel junction measured using conducting atomic force microscopy

Journal of Applied Physics

Volumn 87, Issue 9 II, 2000, Pages 5206-5208

  Ando, Y ^a   Kameda, H ^a   Kubota, H ^a   Miyazaki, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000888838     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373296     Document Type: Article

References (13)

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