Single-event upset and scaling trends in new generation of the commercial SOI powerPC microprocessors

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3563-3568

  Irom, Farokh ^a   Farmanesh, Farhad ^a   Kouba, Coy K ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

Author keywords

Cyclotron; Heavy ion; Microprocessors; Silicon on insulator

Indexed keywords

CYCLOTRONS; HEAVY IONS; MICROPROCESSOR CHIPS;

CORE VOLTAGE; CROSS SECTION; MOTOROLA (CO);

SILICON ON INSULATOR TECHNOLOGY;

EID: 33846305726     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.884383     Document Type: Conference Paper

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