Single event upset characterization of the Pentium® MMX and pentium® II microprocessors using proton irradiation

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1453-1460

  Hiemstra, David M ^a   Baril, Allan ^a  

^a Macdonald Dettwiler   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; PROTON IRRADIATION; SPACE APPLICATIONS;

PENTIUM MMX; SINGLE EVENT LATCHUP; SINGLE EVENT UPSET; TOTAL DOSE EFFECTS;

RADIATION EFFECTS;

EID: 0033332609     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819107     Document Type: Article

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