Morphological evolution of edge-hillocks on single-crystal films having anisotropic drift-diffusion under the capillary and electromigration forces

Thin Solid Films

Volumn 515, Issue 5, 2007, Pages 2974-2983

  Ogurtani, Tarik Omer ^a   Celik, Aytac ^a   Oren, Ersin Emre ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

Computer simulations; Electromigration; Models of non equilibrium phenomena; Solid gas interfaces; Surface diffusion

Indexed keywords

ANISOTROPY; BOUNDARY VALUE PROBLEMS; COMPUTER SIMULATION; ELECTROMIGRATION; METALLIC FILMS; SINGLE CRYSTALS;

ANISOTROPIC DRIFT-DIFFUSION; ELECTROMIGRATION FORCES; SINGLE-CRYSTAL FILMS;

THIN FILMS;

EID: 33845959738     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.08.020     Document Type: Article

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